PRECURSOR ION MS/MS SCANS IN SINGLE ION TRAPS AND METHODS OF USE THEREOF

A new ion-trapping method simplifies mass spectrometer analyzer instruments, enabling highly accurate on-site analysis and various advanced scanning techniques.
Technology No. 2016-COOK-67317

Accurately assessing an extremely small quantity of a substance challenges researchers in many fields, notably in chemistry and physics. Mass spectrometers have been used in this endeavor for decades, with modern spectrometry techniques dating back nearly one hundred years. However, modern mass spectrometers, while quite powerful, are intricate in nature. They typically include multiple analyzer instruments such as a triple quadrupole system or hybrid Q-TOF instruments. Simplifying the analyzing instruments is a key focus of improving mass spectrometers, which would allow for better on-site analysis.

Researchers at Purdue University have developed a new method of trapping ions in a mass spectrometer. Using both a radio frequency signal and two alternating current signals, tandem mass spectrometer experiments can be performed with an ion trap. In addition, further developments could yield minimal interference in the tandem mass spectrometer spectra, which would allow various scans, such as precursor ion and neutral loss, to be performed with a high degree of accuracy. Thus, this improvement not only helps simplify the analyzer instruments, but makes in situ analysis easily accessible.

Advantages:

-Simplified analyzer instruments

-Valuable for on-site analysis

Potential Applications:

-Analytical chemistry

-Physics

TRL: 3

Intellectual Property:

Provisional-Patent, 2015-11-02, United States | PCT-Patent, 2016-11-02, WO | Provisional-Patent, 2017-05-23, United States | NATL-Patent, 2018-05-01, United States | CON-Gov. Funding, 2022-04-27, United States

Keywords: Mass spectrometer, ion trap, tandem mass spectrometry, simplified analyzer, on-site analysis, analytical chemistry, physics, radio frequency signal, alternating current signals, precursor ion scan, neutral loss scan, Chemical Engineering, Chemistry and Chemical Analysis, Ion Trap, Mass Spectrometry

  • expand_more mode_edit Authors (3)
    Robert Graham Cooks
    Christopher Pulliam
    Dalton Thomas Snyder
  • expand_more cloud_download Supporting documents (1)
    Product brochure
    PRECURSOR ION MS/MS SCANS IN SINGLE ION TRAPS AND METHODS OF USE THEREOF.pdf
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