Axially-offset DIC Microscopy for Quantitative Phase Imaging with Wavefront Shaping

A novel axially-offset differential interference contrast (ADIC) microscopy method provides superior, artifact-free detection and fast data acquisition for imaging weakly scattering specimens, compatible with most existing optical microscopes.
Technology No. 2019-SIMP-68375

Quantitative phase imaging (QPI) is an emerging group of microscopy methods that detect weakly scattering and absorbing specimens, such as living cells, unstained tissues, or 2D nanomaterials. Most current QPI approaches, such as Nomarski or Zernike phase contrast microscopy, suffer from imaging artifacts caused by the inherent subtle mechanical vibrations and by the indirect recovery of phase information from image analysis. The research community will benefit from a versatile and simple QPI approach that is compatible to popular advanced optical microscopes used in modern biological and biomedical studies.

Researchers at Purdue University have developed a novel microscopy method called axially-offset differential interference contrast (ADIC) microscopy that does not suffer from the imaging artifacts encountered in current QPI approaches and supports high signal-to-noise detection and fast data aquisition. This technology has been demonstrated and proven to depict the detailed spatial distribution of the fibrils in mouse tail tissues.

Advantages:

-Removes image artifacts

-High signal-to-noise lock-in detection

-Compatible with most existing optical microscopes

Potential Applications:

-Bright field microscopy

-Nonlinear multimodal microscopy

-Photothermal microscopy

TRL: 4

Intellectual Property:

Provisional-Patent, 2018-09-04, United States | Utility Patent, 2019-09-04, United States | CON-Gov. Funding, 2021-04-26, United States

Keywords: Quantitative phase imaging, QPI, microscopy methods, living cells, unstained tissues, 2D nanomaterials, ADIC microscopy, axially-offset differential interference contrast, optical microscopes, image artifacts removed, high signal-to-noise detection

  • expand_more mode_edit Authors (4)
    Fengyuan Deng
    Changqin Ding
    Chen Li
    Garth Jason Simpson
  • expand_more cloud_download Supporting documents (1)
    Product brochure
    Axially-offset DIC Microscopy for Quantitative Phase Imaging with Wavefront Shaping.pdf
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